Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12396207 | Silicon carbide semiconductor device and power conversion apparatus | Toshikazu Tanioka | 2025-08-19 |
| 7065238 | Defect inspection method and defect inspection equipment | Ayumu Onoyama, Koichi Sakurai, Kazuhiro Oka, Hiroyuki Ishii | 2006-06-20 |