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Semiconductor structure with multiple transistors having various threshold voltages |
Dalong Zhao, Teymur Bakhishev, Paul E. Gregory, Michael Duane, U.C. Sridharan +3 more |
2019-02-26 |
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Semiconductor structure with multiple transistors having various threshold voltages |
Dalong Zhao, Teymur Bakhishev, Paul E. Gregory, Michael Duane, U.C. Sridharan +3 more |
2018-07-03 |
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Semiconductor structure with multiple transistors having various threshold voltages |
Dalong Zhao, Teymur Bakhishev, Paul E. Gregory, Michael Duane, U.C. Sridharan +3 more |
2017-11-07 |
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Reducing or eliminating pre-amorphization in transistor manufacture |
Pushkar Ranade, Charles Stager, Urupattur C. Sridharan, Dalong Zhao |
2017-10-17 |
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Reducing or eliminating pre-amorphization in transistor manufacture |
Pushkar Ranade, Charles Stager, Urupattur C. Sridharan, Dalong Zhao |
2016-12-06 |
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CMOS structures and processes based on selective thinning |
Scott E. Thompson, Thomas Hoffmann, Urupattur C. Sridharan, Dalong Zhao, Pushkar Ranade +2 more |
2016-07-12 |
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Semiconductor structure with multiple transistors having various threshold voltages |
Dalong Zhao, Teymur Bakhishev, Paul E. Gregory, Michael Duane, U.C. Sridharan +3 more |
2016-03-29 |
| 9112057 |
Semiconductor devices with dopant migration suppression and method of fabrication thereof |
Sameer Pradhan, Dalong Zhao, Lingquan Wang, Pushkar Ranade |
2015-08-18 |
| 9105711 |
Semiconductor structure with reduced junction leakage and method of fabrication thereof |
Lingquan Wang, Teymur Bakhishev, Dalong Zhao, Pushkar Ranade, Sameer Pradhan +2 more |
2015-08-11 |
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Deeply depleted MOS transistors having a screening layer and methods thereof |
Thomas Hoffmann, Lucian Shifren, Scott E. Thompson, Pushkar Ranade, Jing Wang +10 more |
2015-05-26 |
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Semiconductor structure with substitutional boron and method for fabrication thereof |
Pushkar Ranade, Charles Stager, Lucian Shifren, Dalong Zhao, U.C. Sridharan +1 more |
2015-04-07 |
| 8937005 |
Reducing or eliminating pre-amorphization in transistor manufacture |
Pushkar Ranade, Charles Stager, Urupattur C. Sridharan, Dalong Zhao |
2015-01-20 |
| 8877619 |
Process for manufacture of integrated circuits with different channel doping transistor architectures and devices therefrom |
Scott E. Thompson, Lucian Shifren, Pushkar Ranade, Dalong Zhao, Teymur Bakhisher +1 more |
2014-11-04 |
| 8796048 |
Monitoring and measurement of thin film layers |
Scott E. Thompson, Pushkar Ranade, Charles Stager |
2014-08-05 |
| 8778786 |
Method for substrate preservation during transistor fabrication |
Pushkar Ranade, Dalong Zhao, Teymur Bakhishev, Urupattur C. Sridharan, Taiji Ema +5 more |
2014-07-15 |
| 8637955 |
Semiconductor structure with reduced junction leakage and method of fabrication thereof |
Lingquan Wang, Teymur Bakhishev, Dalong Zhao, Pushkar Ranade, Sameer Pradhan +2 more |
2014-01-28 |
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CMOS structures and processes based on selective thinning |
Scott E. Thompson, Thomas Hoffmann, U.C. Sridharan, Dalong Zhao, Pushkar Ranade +2 more |
2013-12-24 |
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Reducing or eliminating pre-amorphization in transistor manufacture |
Pushkar Ranade, Charles Stager, Urupattur C. Sridharan, Dalong Zhao |
2013-10-29 |