JK

Joseph Karniewicz

Micron: 17 patents #998 of 6,345Top 20%
📍 Boise, ID: #552 of 3,546 inventorsTop 20%
🗺 Idaho: #820 of 8,810 inventorsTop 10%
Overall (All Time): #279,545 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
7096446 Hierarchical semiconductor design 2006-08-22
6922659 Parameter population of cells of a hierarchical semiconductor structure via file relation 2005-07-26
6449757 Hierarchical semiconductor design 2002-09-10
6404018 Static memory cell and method of manufacturing a static memory cell Jeff Zhiqiang Wu 2002-06-11
6184539 Static memory cell and method of forming static memory cell Jeff Zhiqiang Wu 2001-02-06
6140685 Static memory cell and method of manufacturing a static memory cell Jeff Zhiqiang Wu 2000-10-31
5976926 Static memory cell and method of manufacturing a static memory cell Jeff Zhiqiang Wu 1999-11-02
5780906 Static memory cell and method of manufacturing a static memory cell Jeff Zhiqiang Wu 1998-07-14
5770497 Method of manufacturing a novel static memory cell having a tunnel diode Jeff Zhiqiang Wu 1998-06-23
5757051 Static memory cell and method of manufacturing a static memory cell Jeff Zhiqiang Wu 1998-05-26
5672536 Method of manufacturing a novel static memory cell having a tunnel diode Jeff Zhiqiang Wu 1997-09-30
5629546 Static memory cell and method of manufacturing a static memory cell Jeff Zhiqiang Wu 1997-05-13
5135882 Technique for forming high-value inter-nodal coupling resistance for rad-hard applications in a double-poly, salicide process using local interconnect 1992-08-04
5134085 Reduced-mask, split-polysilicon CMOS process, incorporating stacked-capacitor cells, for fabricating multi-megabit dynamic random access memories Brent Gilgen, Tyler Lowrey, Anthony M. McQueen 1992-07-28
5057449 Process for creating two thicknesses of gate oxide within a dynamic random access memory Tyler Lowrey, Fernando Gonzalez 1991-10-15
5030585 Split-polysilicon CMOS DRAM process incorporating selective self-aligned silicidation of conductive regions and nitride blanket protection of N-channel regions during P-channel gate spacer formation Fernando Gonzalez 1991-07-09
5026657 Split-polysilicon CMOS DRAM process incorporating self-aligned silicidation of the cell plate, transistor gates, and N+ regions Ruojia Lee, Tyler Lowrey, Fernando Gonzalez, Pierre C. Fazan 1991-06-25