Issued Patents All Time
Showing 1–21 of 21 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11960906 | Output impedance calibration, and related devices, systems, and methods | — | 2024-04-16 |
| 11922996 | Apparatuses, systems, and methods for ZQ calibration | Won Joo Yun | 2024-03-05 |
| 11848065 | Impedance calibration via a number of calibration circuits, and associated methods, devices and systems | — | 2023-12-19 |
| 11677537 | Signal delay control and related apparatuses, systems, and methods | Won Joo Yun, Baekkyu Choi | 2023-06-13 |
| 11670397 | Output impedance calibration, and related devices, systems, and methods | Masayoshi Yamazaki | 2023-06-06 |
| 11646073 | Reference-voltage-generators within integrated assemblies | Takamasa Suzuki, Yasuo Satoh, Yuan He | 2023-05-09 |
| 11619964 | Methods for improving timing in memory devices, and related devices and systems | Won Joo Yun | 2023-04-04 |
| 11494198 | Output impedance calibration, and related devices, systems, and methods | — | 2022-11-08 |
| 11443788 | Reference-voltage-generators within integrated assemblies | Takamasa Suzuki, Yasuo Satoh, Yuan He | 2022-09-13 |
| 11398266 | Integrated assemblies having memory cells with capacitive units and reference-voltage-generators with resistive units | Takamasa Suzuki, Yasuo Satoh, Yuan He | 2022-07-26 |
| 11302387 | Input/output capacitance measurement, and related methods, devices, and systems | — | 2022-04-12 |
| 11145383 | Impedance calibration via a number of calibration circuits, and associated methods, devices, and systems | — | 2021-10-12 |
| 10938416 | Memory device including parity error detection circuit | Hye-Seung Yu, Sukyong Kang, Wonjoo Yun, Jae-Hun Jung | 2021-03-02 |
| 10908212 | Semiconductor memory device including a shift register | Hye-Seung Yu, Won Joo Yun | 2021-02-02 |
| 10902907 | Output drivers, and related methods, memory devices, and systems | — | 2021-01-26 |
| 10839889 | Apparatuses and methods for providing clocks to data paths | Chiaki Dono, Chikara Kondo | 2020-11-17 |
| 10790039 | Semiconductor device having a test circuit | Chiaki Dono | 2020-09-29 |
| 10509070 | Short circuit detecting device of stacked memory chips and method thereof | Won Joo Yun, Sukyong Kang, Hye-Seung Yu | 2019-12-17 |
| 10243584 | Memory device including parity error detection circuit | Hye-Seung Yu, Sukyong Kang, Wonjoo Yun, Jae-Hun Jung | 2019-03-26 |
| 10078110 | Short circuit detecting device of stacked memory chips and method thereof | Won Joo Yun, Sukyong Kang, Hye-Seung Yu | 2018-09-18 |
| 9870808 | Memory device for performing calibration operation | Won Joo Yun, Hye-Seung Yu, In-Dal Song | 2018-01-16 |