DH

Deping He

Micron: 62 patents #269 of 6,345Top 5%
📍 Boise, ID: #148 of 3,546 inventorsTop 5%
🗺 Idaho: #197 of 8,810 inventorsTop 3%
Overall (All Time): #35,176 of 4,157,543Top 1%
63
Patents All Time

Issued Patents All Time

Showing 26–50 of 63 patents

Patent #TitleCo-InventorsDate
11899963 Suspension during a multi-plane write procedure Caixia Yang 2024-02-13
11886266 Dynamic power control Junjun Wang, Yanming Liu, Hua Tan 2024-01-30
11874772 Garbage collection adapted to host write activity Qing Liang, David Aaron Palmer 2024-01-16
11829613 Power behavior detection in a memory device Chun Sum Yeung 2023-11-28
11782787 Dynamic error control configuration for memory systems Zhengang Chen 2023-10-10
11726863 Memory data correction using multiple error control operations Qing Liang 2023-08-15
11720261 Transferring memory system data to a host system Qing Liang, Nadav Grosz, Jonathan S. Parry 2023-08-08
11721398 Techniques for determining memory cell read offsets Jingyuan Miao 2023-08-08
11720253 Access of a memory system based on fragmentation Jun-Chi Huang, Bhagyashree Bokade, Violet Gomm, Lavanya Sriram 2023-08-08
11714563 Volatile register to detect power loss Jonathan S. Parry 2023-08-01
11709617 Multi-stage memory device performance notification Qing Liang, Mingke Yu 2023-07-25
11693769 Garbage collection adapted to memory device life expectancy Qing Liang, David Aaron Palmer 2023-07-04
11694760 Uncorrectable ECC Jianmin Huang, Xiangang Luo, Harish Reddy Singidi, Kulachet Tanpairoj, John Zhang +1 more 2023-07-04
11656940 Techniques for managing temporarily retired blocks of a memory system Chun Sum Yeung, Jonathan S. Parry 2023-05-23
11561892 Garbage collection adapted to user device access Qing Liang, David Aaron Palmer 2023-01-24
11556479 Cache block budgeting techniques David Aaron Palmer 2023-01-17
11550711 Dynamically adjusted garbage collection workload Nadav Grosz, Qing Liang, David Aaron Palmer 2023-01-10
11494095 Power behavior detection in a memory device Chun Sum Yeung 2022-11-08
11380419 Methods to limit power during stress test and other limited supplies environment Jonathan S. Parry, Giuseppe Cariello 2022-07-05
11314427 Memory device with enhanced data reliability capabilities David Aaron Palmer 2022-04-26
11314583 Memory data correction using multiple error control operations Qing Liang 2022-04-26
11287990 Solid state storage device with quick boot from NAND media Qing Liang 2022-03-29
11288149 Flash memory block retirement policy Harish Reddy Singidi, Giuseppe Cariello, Scott Anthony Stoller, Devin M. Batutis, Preston A. Thomson 2022-03-29
11194643 Access operation status signaling for memory systems Qing Liang, Jonathan S. Parry, Giuseppe Cariello 2021-12-07
11188461 Garbage collection adapted to memory device life expectancy Qing Liang, David Aaron Palmer 2021-11-30