CK

Casey Kurth

Micron: 60 patents #280 of 6,345Top 5%
QR Qromis: 1 patents #7 of 12Top 60%
📍 Boise, ID: #155 of 3,546 inventorsTop 5%
🗺 Idaho: #204 of 8,810 inventorsTop 3%
Overall (All Time): #36,134 of 4,157,543Top 1%
62
Patents All Time

Issued Patents All Time

Showing 26–50 of 62 patents

Patent #TitleCo-InventorsDate
6788603 ROM embedded DRAM with bias sensing Scott J. Derner, Phillip G. Wald 2004-09-07
6785167 ROM embedded DRAM with programming Scott J. Derner, Phillip G. Wald 2004-08-31
6781867 Embedded ROM device using substrate leakage Scott J. Derner, Phillip G. Wald 2004-08-24
6771529 ROM embedded DRAM with bias sensing Scott J. Derner, Phillip G. Wald 2004-08-03
6768664 ROM embedded DRAM with bias sensing Scott J. Derner, Phillip G. Wald 2004-07-27
6747889 Half density ROM embedded DRAM Scott J. Derner, Phillip G. Wald 2004-06-08
6735108 ROM embedded DRAM with anti-fuse programming Scott J. Derner, Phillip G. Wald 2004-05-11
6731556 DRAM with bias sensing Scott J. Derner, Phillip G. Wald 2004-05-04
6724238 Antifuse circuit with improved gate oxide reliability Scott J. Derner 2004-04-20
6665207 ROM embedded DRAM with dielectric removal/short Phillip G. Wald, Scott J. Derner 2003-12-16
6661693 Circuit for programming antifuse bits Patrick J. Mullarkey, Jason Graalum, Daryl L. Habersetzer 2003-12-09
6650587 Partial array self-refresh Scott J. Derner, Daryl L. Habersetzer 2003-11-18
6646459 Method for disabling and re-enabling access to IC test functions Daryl L. Habersetzer, Patrick J. Mullarkey, Jason Graalum 2003-11-11
6611165 Antifuse circuit with improved gate oxide reliabilty Scott J. Derner 2003-08-26
6603693 DRAM with bias sensing Scott J. Derner, Phillip G. Wald 2003-08-05
6590407 Apparatus for disabling and re-enabling access to IC test functions Daryl L. Habersetzer, Patrick J. Mullarkey, Jason Graalum 2003-07-08
6570400 Method for disabling and re-enabling access to IC test functions Daryl L. Habersetzer, Patrick J. Mullarkey, Jason Graalum 2003-05-27
6545899 ROM embedded DRAM with bias sensing Scott J. Derner, Phillip G. Wald 2003-04-08
6472328 Methods of forming an electrical contact to semiconductive material Terry L. Gilton, Russ Meyer, Phillip G. Wald 2002-10-29
6445605 Circuit for programming antifuse bits Patrick J. Mullarkey, Jason Graalum, Daryl L. Habersetzer 2002-09-03
6410385 ROM-embedded-DRAM Scott J. Derner, Patrick J. Mullarkey 2002-06-25
6385691 Memory device with command buffer that allows internal command buffer jumps Patrick J. Mullarkey, Scott J. Derner 2002-05-07
6356491 Method and circuit for rapidly equilibrating paired digit lines of a memory device during testing Patrick J. Mullarkey 2002-03-12
6281131 Methods of forming electrical contacts Terry L. Gilton, Russ Meyer, Phillip G. Wald 2001-08-28
6255838 Apparatus and method for disabling and re-enabling access to IC test functions Daryl L. Habersetzer, Patrick J. Mullarkey, Jason Graalum 2001-07-03