Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854639 | Test circuit in scribe region for memory failure analysis | Takeshi Kaku, Soeparto Tandjoeng | 2023-12-26 |
| 10833087 | Semiconductor devices including transistors comprising a charge trapping material, and related systems and methods | Fredrick Fishburn, Haitao Liu, Soichi Sugiura, Oscar O. Enomoto, Mark A. Zaleski +4 more | 2020-11-10 |