Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854639 | Test circuit in scribe region for memory failure analysis | Atsuko Otsuka, Takeshi Kaku | 2023-12-26 |
| 7299381 | Discrete tests for weak bits | — | 2007-11-20 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11854639 | Test circuit in scribe region for memory failure analysis | Atsuko Otsuka, Takeshi Kaku | 2023-12-26 |
| 7299381 | Discrete tests for weak bits | — | 2007-11-20 |