JC

Jindong Cui

MT Mettler-Toledo (Changzhou) Measurement Technology: 2 patents #26 of 125Top 25%
MI Mettler-Toledo (Changzhou) Precision Instruments: 2 patents #23 of 122Top 20%
MC Mettler-Toledo International Trading (Shanghai) Co.: 2 patents #22 of 119Top 20%
Overall (All Time): #1,713,781 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12306032 Weighing system and weighing method with object recognition Song Zhang, Shilong Wang, Shenjian Qian, Gang Yang 2025-05-20
11846539 Method and system for measuring interference in a checkweighing device Shilong Wang, Huifang Wu, Ming Cai, Qi Han, Dongjie Qiu +2 more 2023-12-19