MC

Ming Cai

MT Mettler-Toledo (Changzhou) Measurement Technology: 1 patents #38 of 125Top 35%
MI Mettler-Toledo (Changzhou) Precision Instruments: 1 patents #37 of 122Top 35%
MC Mettler-Toledo International Trading (Shanghai) Co.: 1 patents #36 of 119Top 35%
UM United Microelectronics: 1 patents #2,686 of 4,560Top 60%
Overall (All Time): #1,829,918 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
11846539 Method and system for measuring interference in a checkweighing device Shilong Wang, Huifang Wu, Qi Han, Dongjie Qiu, Wenjun Jiang +2 more 2023-12-19
11374011 Method of manufacturing dynamic random access memory Akira Kuroda, Hsin-Ya Wang, Chang-Han Tsai 2022-06-28