DQ

Dongjie Qiu

MT Mettler-Toledo (Changzhou) Measurement Technology: 1 patents #38 of 125Top 35%
MI Mettler-Toledo (Changzhou) Precision Instruments: 1 patents #37 of 122Top 35%
MC Mettler-Toledo International Trading (Shanghai) Co.: 1 patents #36 of 119Top 35%
Overall (All Time): #2,627,339 of 4,157,543Top 65%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11846539 Method and system for measuring interference in a checkweighing device Shilong Wang, Huifang Wu, Ming Cai, Qi Han, Wenjun Jiang +2 more 2023-12-19