| 12341310 |
Automatic insertion and removal device for connector, automatic insertion method, automatic removal method, and computer-readable storage medium |
Kun Niu, Zuolin Gao, Hongjun Zhu, Chao Chen, Weiping Yi |
2025-06-24 |
| 8209572 |
Testing embedded memories in an integrated circuit |
Don E. Ross, Wu-Tung Cheng, Joseph C. Rayhawk |
2012-06-26 |
| 7831871 |
Testing embedded memories in an integrated circuit |
Don E. Ross, Wu-Tung Cheng, Joseph C. Rayhawk |
2010-11-09 |
| 7502976 |
Testing embedded memories in an integrated circuit |
Don E. Ross, Wu-Tung Cheng, Joseph C. Rayhawk |
2009-03-10 |
| 7434131 |
Flexible memory built-in-self-test (MBIST) method and apparatus |
Nilanjan Mukherjee, Wu-Tung Cheng |
2008-10-07 |
| 7428680 |
Programmable memory built-in-self-test (MBIST) method and apparatus |
Nilanjan Mukherjee, Wu-Tung Cheng |
2008-09-23 |
| 7426668 |
Performing memory built-in-self-test (MBIST) |
Nilanjan Mukherjee, Wu-Tung Cheng |
2008-09-16 |
| 7200786 |
Built-in self-analyzer for embedded memory |
Wu-Tung Cheng, Joseph C. Rayhawk |
2007-04-03 |