WU

Willem Henk Urbanus

MB Mapper Lithography Ip B.V.: 7 patents #16 of 84Top 20%
AB Asml Netherlands B.V.: 6 patents #712 of 3,192Top 25%
📍 Delft, NL: #36 of 1,192 inventorsTop 4%
Overall (All Time): #365,591 of 4,157,543Top 9%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
12387903 Aberration correction in charged particle system Alexander Hendrik Vincent Van Veen, Marco Jan-Jaco Wieland 2025-08-12
11961627 Vacuum chamber arrangement for charged particle beam generator Alexander Hendrik Vincent Van Veen, Marco Jan-Jaco Wieland 2024-04-16
11705252 Vacuum chamber arrangement for charged particle beam generator Alexander Hendrik Vincent Van Veen, Marco Jan-Jaco Wieland 2023-07-18
11348756 Aberration correction in charged particle system Alexander Hendrik Vincent Van Veen, Marco Jan-Jaco Wieland 2022-05-31
11094426 Vacuum chamber arrangement for charged particle beam generator Alexander Hendrik Vincent Van Veen, Marco Jan-Jaco Wieland 2021-08-17
10586625 Vacuum chamber arrangement for charged particle beam generator Alexander Hendrik Vincent Van Veen, Marco Jan-Jaco Wieland 2020-03-10
10037864 High voltage shielding and cooling in a charged particle beam generator Alexander Hendrik Vincent Van Veen 2018-07-31
9905322 Multi-electrode electron optics Marco Jan-Jaco Wieland 2018-02-27
9653261 Charged particle lithography system and beam generator Alexander Hendrik Vincent Van Veen 2017-05-16
9355751 Multi-electrode stack arrangement Marco Jan-Jaco Wieland 2016-05-31
9165693 Multi-electrode cooling arrangement Marco Jan-Jaco Wieland 2015-10-20
8916837 Charged particle lithography system with intermediate chamber Laura Dinu-Gürtler, Marco Jan-Jaco Wieland, Stijn Willem Herman Karel Steenbrink 2014-12-23
8586949 Charged particle lithography system with intermediate chamber Laura Dinu-Gürtler, Marco Jan-Jaco Wieland, Stijn Willem Herman Karel Steenbrink 2013-11-19