Issued Patents All Time
Showing 26–27 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6799152 | Critical dimension statistical process control in semiconductor fabrication | Chih-Ping Chen, Shao-Chung Hsu, De Chuan Liu, Jung-Kuei Lu, Cheng-Yi Lin +3 more | 2004-09-28 |
| 5883001 | Integrated circuit passivation process and structure | Been-Yih Jin, Daniel Yen, Wen-Yen Hwang, Ming Hong Wang, Sheng Hsien Wong +4 more | 1999-03-16 |