Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12348562 | Detection of content generated from phishing attacks | Iosif V. Onut, Guy-Vincent Jourdan | 2025-07-01 |
| 12210622 | Deep sequential anomalous events detection | Zhilu Zhang, Baris Coskun, Wei Ding | 2025-01-28 |
| 12028362 | Detecting anomalous storage service events using autoencoders | Wei Ding, Oleg Yurievich Polyakov, Baris Coskun | 2024-07-02 |
| 11818170 | Detection of phishing campaigns based on deep learning network detection of phishing exfiltration communications | Iosif V. Onut, Guy-Vincent Jourdan | 2023-11-14 |
| 11803095 | Method for implementing folding MxN wavelength selective switch | Genxiang Chen, Yunshu Gao, Nan Wang, Bing YU, Shengjuan Peng | 2023-10-31 |
| 11303674 | Detection of phishing campaigns based on deep learning network detection of phishing exfiltration communications | Iosif V. Onut, Guy-Vincent Jourdan | 2022-04-12 |
| 11277443 | Detection of phishing internet link | Iosif V. Onut, Guy-Vincent Jourdan | 2022-03-15 |
| 10826935 | Phishing detection through secure testing implementation | Iosif V. Onut, Aviv Ron, Avishay Bartik, Russell Couturier, Gregor von Bochmann +1 more | 2020-11-03 |
| 8815974 | Dental adhesive composition | Koji Matsushige, Ayumi Dodomi | 2014-08-26 |
| 8539411 | Multiple derating factor sets for delay calculation and library generation in multi-corner STA sign-off flow | Sandeep Bhutani | 2013-09-17 |
| 8357731 | One-package type tooth surface coating material | Koji Matsushige, Mikio Kimura | 2013-01-22 |
| 7299435 | Frequency dependent timing margin | Sandeep Bhutani, Jason R. Potnick | 2007-11-20 |
| 7260801 | Delay computation speed up and incrementality | Sandeep Bhutani, Weiqing Guo | 2007-08-21 |
| 7228516 | Negative bias temperature instability modeling | Sandeep Bhutani | 2007-06-05 |
| 7207021 | Method for estimating a frequency-based ramptime limit | Chun Chan | 2007-04-17 |
| 7069178 | Method of predicting quiescent current variation of an integrated circuit die from a process monitor derating factor | Sandeep Bhutani | 2006-06-27 |
| 6880142 | Method of delay calculation for variation in interconnect metal process | Robert W. Davis, Sandeep Bhutani, Payman Zarkesh-Ha, John D. Corbeil, Jr., Prabhakaran Krishnamurthy | 2005-04-12 |