Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7930655 | Yield profile manipulator | ChandraSekhar Desu, Bruce Whitefield, David Abercrombie, David J. Sturtevant | 2011-04-19 |
| 7395522 | Yield profile manipulator | ChandraSekhar Desu, Bruce Whitefield, David Abercrombie, David J. Sturtevant | 2008-07-01 |
| 7299158 | Process control data collection | Theodore O. Meyer, Thomas Charles Hann | 2007-11-20 |
| 6797585 | Nonintrusive wafer marking | Theodore O. Meyer | 2004-09-28 |
| 6775630 | Web-based interface with defect database to view and update failure events | James W. Seale, Newell E. Chiesl, Mark A. Giewont, Robert Powell | 2004-08-10 |