Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8796654 | Scan device for microscope measurement instrument | Masahiro Ohta, Noriaki Oyabu, Kenjiro Kimura, Shinichiro Ido, Kei Kobayashi +1 more | 2014-08-05 |
| 8536862 | Apparatus and method of obtaining field by measurement | Kenjiro Kimura, Kei Kobayashi, Hirofumi Yamada, Takashi Horiuchi, Nobuo Satoh +1 more | 2013-09-17 |
| 8225418 | Method for processing output of scanning type probe microscope, and scanning type probe microscope | Eika Tsunemi, Nobuo Satoh, Kei Kobayashi, Hirofumi Yamada | 2012-07-17 |
| 7829863 | Electron beam irradiation device | Kenjiro Kimura, Kei Kobayashi, Hirofumi Yamada | 2010-11-09 |
| 6823724 | Method and apparatus for measuring values of physical property | Kei Kobayashi, Hirofumi Yamada | 2004-11-30 |
| 6702175 | Method of soldering using lead-free solder and bonded article prepared through soldering by the method | Toshihisa Horiuchi, Takashi Ikari, Kenichiro Suetsugu, Masato Hirano, Shunji Hibino +1 more | 2004-03-09 |