Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12188891 | Charge amount measurement method and charge amount measurement system | Masaru Inoue | 2025-01-07 |
| 11994487 | Measuring container, measuring system and measuring method | Masaru Inoue | 2024-05-28 |
| 8796654 | Scan device for microscope measurement instrument | Masahiro Ohta, Kenjiro Kimura, Shinichiro Ido, Kei Kobayashi, Hirofumi Yamada +1 more | 2014-08-05 |
| 8037739 | Method for analyzing sample in liquid | Masahiro Ota, Hiroaki Adachi, Masayuki Abe, Seizo Morita, Yusuke Mori +1 more | 2011-10-18 |
| 7975316 | Atomic force microscope and interaction force measurement method using atomic force microscope | Masahiro Ota, Masayuki Abe, Oscar Custance, Yoshiaki Sugimoto, Seizo Morita | 2011-07-05 |
| 7703314 | Probe position control system and method | Masayuki Abe, Masahiro Ota, Yoshiaki Sugimoto, Kenichi Morita, Seizo Morita +1 more | 2010-04-27 |