Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7975316 | Atomic force microscope and interaction force measurement method using atomic force microscope | Masahiro Ota, Noriaki Oyabu, Masayuki Abe, Yoshiaki Sugimoto, Seizo Morita | 2011-07-05 |
| 7703314 | Probe position control system and method | Masayuki Abe, Masahiro Ota, Yoshiaki Sugimoto, Kenichi Morita, Noriaki Oyabu +1 more | 2010-04-27 |