Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11078596 | Method for evaluating quality of SiC single crystal body and method for producing silicon carbide single crystal ingot using the same | Masashi Nakabayashi | 2021-08-03 |
| 10012675 | Nanometer standard prototype and method for manufacturing nanometer standard prototype | Tadaaki Kaneko | 2018-07-03 |
| 9029219 | Semiconductor wafer manufacturing method, and semiconductor wafer | Tadaaki Kaneko, Noboru Ohtani, Ayumu Adachi, Satoru Nogami | 2015-05-12 |