Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12019030 | Methods and systems for targeted monitoring of semiconductor measurement quality | Antonio Arion Gellineau, Andrei V. Shchegrov, Hyowon Park, Pavan Gurudath, Christopher Liman | 2024-06-25 |