Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379672 | Metrology of nanosheet surface roughness and profile | Houssam Chouaib, HaoMiao Chang, Teng Gu, Tianrong Zhan, Zhengquan Tan | 2025-08-05 |
| 12085515 | Methods and systems for selecting wafer locations to characterize cross-wafer variations based on high-throughput measurement signals | Brian C. Lin, Jiqiang Li, Song Wu, Tianrong Zhan | 2024-09-10 |