Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7190441 | Methods and systems for preparing a sample for thin film analysis | James T. McWhirter, Liang Wang, Hidong Kwak, Haixing Zou, Dan G. Georgesco +3 more | 2007-03-13 |
| 5771094 | Film measurement system with improved calibration | Joseph R. Carter, Xing Chen | 1998-06-23 |
| 5581350 | Method and system for calibrating an ellipsometer | Xing Chen, Philip D. Flanner, III, Kiron Balkrishna Malwankar | 1996-12-03 |