Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678421 | Target element types for process parameter metrology | Vladimir Levinski, Daniel Kandel | 2017-06-13 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678421 | Target element types for process parameter metrology | Vladimir Levinski, Daniel Kandel | 2017-06-13 |