Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7724375 | Method and apparatus for increasing metrology or inspection tool throughput | Royi Levav, Yaron Zimmerman, Joel Seligson, Vladimir Levinski | 2010-05-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7724375 | Method and apparatus for increasing metrology or inspection tool throughput | Royi Levav, Yaron Zimmerman, Joel Seligson, Vladimir Levinski | 2010-05-25 |