| 11923138 |
Collecting device and collecting method |
Sho Kato, Yuji Yamada |
2024-03-05 |
| 11837510 |
Method for analyzing silicon substrate |
Katsuhiko Kawabata, Mitsumasa Ikeuchi, Sungjae Lee |
2023-12-05 |
| 11640903 |
Analysis apparatus and analysis method |
Miki TAKIMOTO |
2023-05-02 |
| 11607750 |
Analysis apparatus and analysis method |
Yuji Yamada |
2023-03-21 |
| 11310232 |
Network identity authentication method and system, and user agent device used thereby |
Wenyin Liu, Xin Li, Zhiheng Shen, Jialong Zhang, Shuai Fan +1 more |
2022-04-19 |
| 10962519 |
Analysis pretreatment device |
Ayako Mizuno, Yuji Yamada |
2021-03-30 |
| 9658203 |
Metal collection solution and method of analyzing substrate contamination |
Yuji Yamada, Ayako Mizuno |
2017-05-23 |
| 8815107 |
Method of etching surface layer portion of silicon wafer and method of analyzing metal contamination of silicon wafer |
Shabani B. Mohammad |
2014-08-26 |
