Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11976013 | Composite coating layer for ceramic matrix composite substrate | Stephanie Gong, Ngunjoh Lawrence Ndamka, Matthew R. Gold, Li Li, Taylor K. Blair +1 more | 2024-05-07 |
| 11862275 | System and method for verifying and analyzing memory for high performance computing systems | Bosco Chun Sang Lai, Lawrence Wai Cheung Ho, Eric Sin Kwok Chiu, Simon Choi, Arthur Yu Kuen Lam | 2024-01-02 |
| 11175336 | System and method of automated burn-in testing on integrated circuit devices | — | 2021-11-16 |
| 11053578 | Removing coatings from ceramic matrix composite substrates | David C. Fairbourn, Johnny D. Grubbs | 2021-07-06 |
| 10871078 | Low porosity abradable coating | Ngunjoh Lawrence Ndamka, Li Li, Stephanie Gong, Ann Bolcavage, Taylor K. Blair | 2020-12-22 |
| 10851026 | Impurity barrier layer for ceramic matrix composite substrate | Li Li, Sungbo Shim | 2020-12-01 |
| 10851656 | Multilayer environmental barrier coating | Stephanie Gong, Taylor K. Blair, Ngunjoh Lawrence Ndamka, Li Li, Ann Bolcavage | 2020-12-01 |
| 9913140 | User equipment in mobile communication system and control method thereof | Tu Nguyen | 2018-03-06 |
| 9224500 | Systems and methods for testing and assembling memory modules | Lawrence Wai Cheung Ho, Eric Sin Kwok Chiu, Bosco Chun Sang Lai | 2015-12-29 |
| 9117552 | Systems and methods for testing memory | Bosco Chun Sang Lai, Eric Sin Kwok Chiu, Xiaoyi Cao, Shaodong Zhou, Lei Zhang | 2015-08-25 |
| 9003256 | System and method for testing integrated circuits by determining the solid timing window | Bosco Chun Sang Lai | 2015-04-07 |
| 8918686 | Determining data valid windows in a system and method for testing an integrated circuit device | Bosco Chun Sang Lai, Lawrence Wai Cheung Ho | 2014-12-23 |
| 8897305 | Apparatuses and methods for providing emergency service in a wireless communication system | Yeong-Moon Son, Hyun-Jeong Kang, Ki-Back Kim, Young Bae Park, Sang-Kyou Ryou | 2014-11-25 |
| 8356215 | Testing apparatus and method for analyzing a memory module operating within an application system | Bosco Chun Sang Lai, Lawrence Wai Cheung Ho, Shu Man Choi | 2013-01-15 |
| 7848899 | Systems and methods for testing integrated circuit devices | Bosco Chun Sang Lai, Hong Liang Chan, Yu Kuen Lam, Lawrence Wai Cheung Ho | 2010-12-07 |
| 7757144 | System and method for testing integrated circuit modules comprising a plurality of integrated circuit devices | Bosco Chun Sang Lai, Charlie Song, Kevin Chu | 2010-07-13 |
| 7620861 | Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels | Bosco Chun Sang Lai, Lawrence Wai Cheung Ho | 2009-11-17 |
| 7539912 | Method and apparatus for testing a fully buffered memory module | Hong Liang Chan, Allen Lawrence, Joseph C. Klein, Bosco Chun Sang Lai | 2009-05-26 |