Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387813 | Method and system for detecting memory error, and device | — | 2025-08-12 |
| 11862275 | System and method for verifying and analyzing memory for high performance computing systems | Sunny Lai-Ming Chang, Lawrence Wai Cheung Ho, Eric Sin Kwok Chiu, Simon Choi, Arthur Yu Kuen Lam | 2024-01-02 |
| 9224500 | Systems and methods for testing and assembling memory modules | Lawrence Wai Cheung Ho, Eric Sin Kwok Chiu, Sunny Lai-Ming Chang | 2015-12-29 |
| 9117552 | Systems and methods for testing memory | Sunny Lai-Ming Chang, Eric Sin Kwok Chiu, Xiaoyi Cao, Shaodong Zhou, Lei Zhang | 2015-08-25 |
| 9003256 | System and method for testing integrated circuits by determining the solid timing window | Sunny Lai-Ming Chang | 2015-04-07 |
| 8918686 | Determining data valid windows in a system and method for testing an integrated circuit device | Sunny Lai-Ming Chang, Lawrence Wai Cheung Ho | 2014-12-23 |
| 8356215 | Testing apparatus and method for analyzing a memory module operating within an application system | Sunny Lai-Ming Chang, Lawrence Wai Cheung Ho, Shu Man Choi | 2013-01-15 |
| 7848899 | Systems and methods for testing integrated circuit devices | Sunny Lai-Ming Chang, Hong Liang Chan, Yu Kuen Lam, Lawrence Wai Cheung Ho | 2010-12-07 |
| 7757144 | System and method for testing integrated circuit modules comprising a plurality of integrated circuit devices | Sunny Lai-Ming Chang, Charlie Song, Kevin Chu | 2010-07-13 |
| 7620861 | Method and apparatus for testing integrated circuits by employing test vector patterns that satisfy passband requirements imposed by communication channels | Sunny Lai-Ming Chang, Lawrence Wai Cheung Ho | 2009-11-17 |
| 7539912 | Method and apparatus for testing a fully buffered memory module | Hong Liang Chan, Allen Lawrence, Sunny Lai-Ming Chang, Joseph C. Klein | 2009-05-26 |