YK

Yusuke Kohyama

KT Kabushiki Kaisha Toshiba: 73 patents #165 of 21,451Top 1%
TC Toshiba America Electronic Components: 4 patents #5 of 77Top 7%
SO Sony: 2 patents #12,963 of 25,231Top 55%
📍 Yokohama, NY: #9 of 63 inventorsTop 15%
Overall (All Time): #23,212 of 4,157,543Top 1%
79
Patents All Time

Issued Patents All Time

Showing 1–25 of 79 patents

Patent #TitleCo-InventorsDate
12183756 Imaging device Naoki Saka, Shintaro Okamoto, Shigetaka Mori 2024-12-31
12136639 Imaging element and electronic equipment Masashi OHURA 2024-11-05
8310003 Solid-state imaging device with vertical gate electrode and method of manufacturing the same 2012-11-13
8138533 Semiconductor device with an electrode as an alignment mark, and method of manufacturing the same Hidetoshi Koike 2012-03-20
8133753 Solid-state image pickup device and method for manufacturing same 2012-03-13
8039883 Solid-state image pickup device and method for manufacturing same 2011-10-18
7859073 Back-illuminated type solid-state image pickup device and camera module using the same Mie Matsuo 2010-12-28
7696537 Step-embedded SiGe structure for PFET mobility enhancement 2010-04-13
7615813 Semiconductor device using fuse/anti-fuse system Yoshiaki Fukuzumi 2009-11-10
7605042 SOI bottom pre-doping merged e-SiGe for poly height reduction 2009-10-20
7550355 Low-leakage transistor and manufacturing method thereof 2009-06-23
7537981 Silicon on insulator device and method of manufacturing the same 2009-05-26
7514752 Reduction of short-circuiting between contacts at or near a tensile-compressive boundary 2009-04-07
7235882 Semiconductor device having a wiring layer of damascene structure and method for manufacturing the same Hiroyuki Nitta, Yoshiaki Fukuzumi 2007-06-26
7227228 Silicon on insulator device and method of manufacturing the same 2007-06-05
7187027 Stacked capacitor-type semiconductor storage device and manufacturing method thereof Takashi Ohsawa, Shizuo Sawada 2007-03-06
7163894 Semiconductor device having a wiring layer of damascene structure and method for manufacturing the same Hiroyuki Nitta, Yoshiaki Fukuzumi 2007-01-16
7075169 Semiconductor device having a hollow region and method of manufacturing the same Yoshihiro Minami, Takashi Yamada, Tsutomu Sato, Hajime Nagano 2006-07-11
7023044 Stacked capacitor-type semiconductor storage device and manufacturing method thereof Takashi Ohsawa, Shizuo Sawada 2006-04-04
6979866 Semiconductor device with SOI region and bulk region and method of manufacture thereof Atsushi Azuma, Kaori Umezawa 2005-12-27
6977228 Semiconductor device using damascene technique and manufacturing method therefor Nobuo Hayasaka, Katsuya Okumura 2005-12-20
6906419 Semiconductor device having a wiring layer of damascene structure and method for manufacturing the same Hiroyuki Nitta, Yoshiaki Fukuzumi 2005-06-14
6846733 Stacked capacitor-type semiconductor storage device and manufacturing method thereof Takashi Ohsawa, Shizuo Sawada 2005-01-25
6812542 Electric fuse whose dielectric breakdown resistance is controlled by injecting impurities into an insulating film of a capacitor structure, and a method for manufacturing the same 2004-11-02
6774439 Semiconductor device using fuse/anti-fuse system Yoshiaki Fukuzumi 2004-08-10