YT

Yoshinori Tsuchiya

KT Kabushiki Kaisha Toshiba: 58 patents #261 of 21,451Top 2%
DE Denso: 6 patents #2,220 of 11,792Top 20%
MT Mirise Technologies: 1 patents #55 of 133Top 45%
TO Toyota: 1 patents #15,335 of 26,838Top 60%
📍 Yokohama, NY: #12 of 63 inventorsTop 20%
Overall (All Time): #34,574 of 4,157,543Top 1%
64
Patents All Time

Issued Patents All Time

Showing 26–50 of 64 patents

Patent #TitleCo-InventorsDate
8168499 Semiconductor device and method for manufacturing the same Masato Koyama, Seiji Inumiya 2012-05-01
8148787 Semiconductor device and method for manufacturing the same Masato Koyama, Akira Nishiyama, Reika Ichihara 2012-04-03
8129792 Semiconductor device and method for manufacturing the same Reika Ichihara, Hiroki Tanaka, Masahiko Yoshiki, Masato Koyama 2012-03-06
8120117 Semiconductor device with metal gate 2012-02-21
8053300 Semiconductor device Reika Ichihara, Masato Koyama, Akira Nishiyama 2011-11-08
7986014 Semiconductor device Reika Ichihara, Masato Koyama, Akira Nishiyama 2011-07-26
7977182 Method of manufacturing MISFET with low contact resistance Yoshifumi Nishi, Takashi Yamauchi, Junji Koga 2011-07-12
7964489 Semiconductor device Masato Koyama, Yuuichi Kamimuta, Reika Ichihara, Katsuyuki Sekine 2011-06-21
7902612 Semiconductor device and method of manufacturing the same Takashi Yamauchi, Atsuhiro Kinoshita, Junji Koga, Koichi Kato, Nobutoshi Aoki +1 more 2011-03-08
7863695 Complementary MISFET semiconductor device having an atomic density ratio aluminum/lanthanum (Al/La) in the gate insulating layer of PMIS is larger than that of the NMIS Masamichi Suzuki, Masato Koyama, Hirotaka Nishino, Reika Ichihara, Akira Takashima 2011-01-04
7807990 Semiconductor device Masato Koyama, Yuuichi Kamimuta, Reika Ichihara, Katsuyuki Sekine 2010-10-05
7807538 Method of forming a silicide layer while applying a compressive or tensile strain to impurity layers Takashi Yamauchi, Atsuhiro Kinoshita, Junji Koga 2010-10-05
7768077 Semiconductor device and method for manufacturing the same Masato Koyama, Masahiko Yoshiki 2010-08-03
7763946 Semiconductor device and method for manufacturing the same Masato Koyama 2010-07-27
7745888 Method of making p-channel and n-channel MIS transistors using single film formation of TaC Masato Koyama, Reika Ichihara, Yuuichi Kamimuta, Akira Nishiyama 2010-06-29
7737503 Semiconductor device and method for manufacturing the same Masato Koyama, Masahiko Yoshiki 2010-06-15
7728394 Semiconductor device and manufacturing method thereof Masato Koyama, Reika Ichihara, Yuuichi Kamimuta, Akira Nishiyama 2010-06-01
7727832 Semiconductor device and method for manufacturing the same Masato Koyama, Seiji Inumiya 2010-06-01
7718521 Semiconductor device and method for manufacturing the same Masato Koyama, Akira Nishiyama, Reika Ichihara 2010-05-18
7667273 Semiconductor device and method for manufacturing the same Masato Koyama 2010-02-23
7642165 Semiconductor device and fabrication method thereof Masao Shingu, Atsuhiro Kinoshita 2010-01-05
7642604 Semiconductor device and fabrication method of same Yoshifumi Nishi, Takashi Yamauchi, Junji Koga 2010-01-05
7632728 Method of forming TaC gate electrodes with crystal orientation ratio defining the work function Masato Koyama, Reika Ichihara, Yuuichi Kamimuta, Akira Nishiyama 2009-12-15
7612413 Semiconductor device and manufacturing method thereof Masato Koyama, Reika Ichihara, Yuuichi Kamimuta, Akira Nishiyama 2009-11-03
7608896 Semiconductor device Reika Ichihara, Hiroki Tanaka, Masato Koyama 2009-10-27