Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8169040 | Semiconductor device and method for manufacturing the same | Yoshinori Tsuchiya, Masato Koyama | 2012-05-01 |
| 8129792 | Semiconductor device and method for manufacturing the same | Reika Ichihara, Yoshinori Tsuchiya, Hiroki Tanaka, Masato Koyama | 2012-03-06 |
| 7768077 | Semiconductor device and method for manufacturing the same | Yoshinori Tsuchiya, Masato Koyama | 2010-08-03 |
| 7737503 | Semiconductor device and method for manufacturing the same | Yoshinori Tsuchiya, Masato Koyama | 2010-06-15 |
| 7416967 | Semiconductor device, and method for manufacturing the same | Yoshinori Tsuchiya, Masato Koyama | 2008-08-26 |
| 7375327 | Method and device for measuring quantity of wear | Makoto Kato | 2008-05-20 |
| 7358492 | Apparatus, method, and computer program product for deconvolution analysis | Mitsuhiro Tomita, Hiroki Tanaka | 2008-04-15 |
| 5746829 | Impurity concentrator and analyzer | Hideki Matsunaga, Hiroshi Yamaguchi, Mitsuhiro Tomita, Seizou Doi, Shoji Kozuka +1 more | 1998-05-05 |
| 5598025 | Semiconductor device comprises an impurity layer having boron ions in the form of clusters of icosahedron structure | Atsushi Murakoshi, Ichiro Mizushima, Masaharu Watanabe | 1997-01-28 |
| 5413943 | Semiconductor device and method of manufacturing the same | Atsushi Murakoshi, Ichiro Mizushima, Masaharu Watanabe | 1995-05-09 |