Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9437486 | Sputtering target | Koichi Watanabe, Takashi Watanabe, Takashi Ishigami, Yukinobu Suzuki, Naomi Fujioka | 2016-09-06 |
| 7718117 | Tungsten sputtering target and method of manufacturing the target | Koichi Watanabe, Yoichiro Yabe, Takashi Ishigami, Takashi Watanabe, Hitoshi Aoyama +1 more | 2010-05-18 |
| 7153589 | Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin film | Yoshiharu Fukasawa, Yoshiko Tsuji, Mitsushi Ikeda, Michio Sato, Toshihiro Maki | 2006-12-26 |
| 6750542 | Sputter target, barrier film and electronic component | Yukinobu Suzuki, Takashi Ishigami, Naomi Fujioka, Takashi Watanabe, Koichi Watanabe +1 more | 2004-06-15 |
| 6200694 | Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin film | Yoshiharu Fukasawa, Yoshiko Tsuji, Mitsushi Ikeda, Michio Sato, Toshihiro Maki | 2001-03-13 |
| 5913100 | Mo-W material for formation of wiring, Mo-W target and method for production thereof, and Mo-W wiring thin film | Yoshiharu Fukasawa, Yoshiko Tsuji, Mitsushi Ikeda, Michio Sato, Toshihiro Maki | 1999-06-15 |
| 4761074 | Method for measuring impurity concentrations in a liquid and an apparatus therefor | Tohru Niida, Hisao Sato, Hajime Kano | 1988-08-02 |
| 4449816 | Method for measuring the number of hyperfine particles and a measuring system therefor | Yoshihiro Nonaka, Hideo Tachibana | 1984-05-22 |