Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12007861 | Test control device, test system, and control method for device testing with predictable and reduced test times | — | 2024-06-11 |
| 10776007 | Memory management device predicting an erase count | Atsushi Kunimatsu, Masaki Miyagawa, Hiroshi Nozue, Kazuhiro Kawagome, Hiroto Nakai +5 more | 2020-09-15 |
| 9081661 | Memory management device and method for managing access to a nonvolatile semiconductor memory | Yoshiyuki Endo | 2015-07-14 |
| 8612692 | Variable write back timing to nonvolatile semiconductor memory | Kenta Yasufuku, Masaki Miyagawa, Goh Uemura, Tsutomu Owa, Atsushi Kunimatsu | 2013-12-17 |