Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11397841 | Semiconductor integrated circuit, circuit designing apparatus, and circuit designing method | — | 2022-07-26 |
| 11120187 | Semiconductor integrated circuit, circuit designing apparatus, and circuit designing method | — | 2021-09-14 |
| 8774583 | Optical device and optical transmitter | Takashi Shiraishi, Masaharu Doi | 2014-07-08 |
| 8135241 | Optical modulation device utilizing electro-optic effect | Takashi Shiraishi, Tetsuya Miyatake | 2012-03-13 |
| 8127188 | Semiconductor integrated circuit and design automation system | — | 2012-02-28 |
| 7797591 | Semiconductor integrated circuit, design support software system, and automatic test pattern generation system | Chikako Tokunaga | 2010-09-14 |
| 7734975 | Semiconductor integrated circuit having built-n self test circuit of logic circuit and embedded device, and design apparatus thereof | Kenichi Anzou, Chikako Tokunaga | 2010-06-08 |
| 7689078 | Optical device | Akira Ishii, Takehito Tanaka, Masaharu Doi | 2010-03-30 |
| 7643712 | Optical module and optical switching device | Masaharu Doi | 2010-01-05 |
| 7627200 | Optical device | Takashi Shiraishi, Masaharu Doi, Kazuhiro Tanaka | 2009-12-01 |
| 7577885 | Semiconductor integrated circuit, design support software system and automatic test pattern generation system | Chikako Tokunaga | 2009-08-18 |
| 7551820 | Optical device | Akira Ishii, Takehito Tanaka, Masaharu Doi | 2009-06-23 |
| 7526161 | Optical device | Akira Ishii, Takehito Tanaka, Masaharu Doi | 2009-04-28 |
| 7120890 | Apparatus for delay fault testing of integrated circuits | Koji Urata, Kenichi Anzou, Chikako Tokunaga | 2006-10-10 |
| 7099783 | Semiconductor integrated circuit, design support apparatus, and test method | Kenichi Anzou | 2006-08-29 |
| 6980707 | Waveguide type variable optical attenuator | Takafumi Chiba, Satoshi Takasugi, Hisato Uetsuka | 2005-12-27 |