Issued Patents All Time
Showing 1–25 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10706951 | Semiconductor integrated circuit including a memory macro | — | 2020-07-07 |
| 10359470 | Semiconductor integrated circuit and test method thereof | — | 2019-07-23 |
| 10261127 | Semiconductor integrated circuit | Toshiaki Dozaka | 2019-04-16 |
| 10001524 | Semiconductor integrated circuit and test method thereof | — | 2018-06-19 |
| 9557379 | Semiconductor integrated circuit | Chikako Tokunaga | 2017-01-31 |
| 9443611 | Semiconductor integrated circuit with bist circuit | Chikako Tokunaga | 2016-09-13 |
| 9355745 | BIST circuit | — | 2016-05-31 |
| 9330788 | Semiconductor integrated circuit capable of performing self-test | — | 2016-05-03 |
| 9159456 | Semiconductor device | Chikako Tokunaga | 2015-10-13 |
| 8671317 | Built-in self test circuit and designing apparatus | Chikako Tokunaga | 2014-03-11 |
| 8599632 | Semiconductor integrated circuit | Chikako Tokunaga | 2013-12-03 |
| 8201037 | Semiconductor integrated circuit and method for controlling semiconductor integrated circuit | Chikako Tokunaga | 2012-06-12 |
| 8176372 | Semiconductor integrated circuit | Chikako Tokunaga | 2012-05-08 |
| 8134880 | Semiconductor integrated circuit | Chikako Tokunaga | 2012-03-13 |
| 8037376 | On-chip failure analysis circuit and on-chip failure analysis method | Chikako Tokunaga | 2011-10-11 |
| 8032803 | Semiconductor integrated circuit and test system thereof | Chikako Tokunaga | 2011-10-04 |
| 7962821 | Built-in self testing circuit with fault diagnostic capability | Chikako Tokunaga | 2011-06-14 |
| 7890823 | Nonvolatile semiconductor memory system | — | 2011-02-15 |
| 7783942 | Integrated circuit device with built-in self test (BIST) circuit | Chikako Tokunaga | 2010-08-24 |
| 7734975 | Semiconductor integrated circuit having built-n self test circuit of logic circuit and embedded device, and design apparatus thereof | Chikako Tokunaga, Tetsu Hasegawa | 2010-06-08 |
| 7653854 | Semiconductor integrated circuit having a (BIST) built-in self test circuit for fault diagnosing operation of a memory | Chikako Tokunaga | 2010-01-26 |
| 7254762 | Semiconductor integrated circuit | Chikako Tokunaga | 2007-08-07 |
| 7228262 | Semiconductor integrated circuit verification system | Chikako Tokunaga, Takashi Matsumoto | 2007-06-05 |
| 7206984 | Built-in self test circuit and test method for storage device | — | 2007-04-17 |
| 7120890 | Apparatus for delay fault testing of integrated circuits | Koji Urata, Tetsu Hasegawa, Chikako Tokunaga | 2006-10-10 |