Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9557379 | Semiconductor integrated circuit | Kenichi Anzou | 2017-01-31 |
| 9443611 | Semiconductor integrated circuit with bist circuit | Kenichi Anzou | 2016-09-13 |
| 9159456 | Semiconductor device | Kenichi Anzou | 2015-10-13 |
| 8671317 | Built-in self test circuit and designing apparatus | Kenichi Anzou | 2014-03-11 |
| 8599632 | Semiconductor integrated circuit | Kenichi Anzou | 2013-12-03 |
| 8201037 | Semiconductor integrated circuit and method for controlling semiconductor integrated circuit | Kenichi Anzou | 2012-06-12 |
| 8176372 | Semiconductor integrated circuit | Kenichi Anzou | 2012-05-08 |
| 8134880 | Semiconductor integrated circuit | Kenichi Anzou | 2012-03-13 |
| 8037376 | On-chip failure analysis circuit and on-chip failure analysis method | Kenichi Anzou | 2011-10-11 |
| 8032803 | Semiconductor integrated circuit and test system thereof | Kenichi Anzou | 2011-10-04 |
| 7962821 | Built-in self testing circuit with fault diagnostic capability | Kenichi Anzou | 2011-06-14 |
| 7797591 | Semiconductor integrated circuit, design support software system, and automatic test pattern generation system | Tetsu Hasegawa | 2010-09-14 |
| 7783942 | Integrated circuit device with built-in self test (BIST) circuit | Kenichi Anzou | 2010-08-24 |
| 7734975 | Semiconductor integrated circuit having built-n self test circuit of logic circuit and embedded device, and design apparatus thereof | Kenichi Anzou, Tetsu Hasegawa | 2010-06-08 |
| 7653854 | Semiconductor integrated circuit having a (BIST) built-in self test circuit for fault diagnosing operation of a memory | Kenichi Anzou | 2010-01-26 |
| 7577885 | Semiconductor integrated circuit, design support software system and automatic test pattern generation system | Tetsu Hasegawa | 2009-08-18 |
| 7254762 | Semiconductor integrated circuit | Kenichi Anzou | 2007-08-07 |
| 7228262 | Semiconductor integrated circuit verification system | Kenichi Anzou, Takashi Matsumoto | 2007-06-05 |
| 7120890 | Apparatus for delay fault testing of integrated circuits | Koji Urata, Kenichi Anzou, Tetsu Hasegawa | 2006-10-10 |