MT

Masakatsu Tsuchiaki

KT Kabushiki Kaisha Toshiba: 27 patents #978 of 21,451Top 5%
📍 Fishkill, NY: #27 of 387 inventorsTop 7%
🗺 New York: #4,646 of 115,490 inventorsTop 5%
Overall (All Time): #147,131 of 4,157,543Top 4%
27
Patents All Time

Issued Patents All Time

Showing 1–25 of 27 patents

Patent #TitleCo-InventorsDate
9093504 Semiconductor device manufacturing method and semiconductor device 2015-07-28
7939869 Semiconductor device having a magnetization configuration of source and drain ferromagnetic electrodes and method of manufacturing the same Yoshiaki Saito 2011-05-10
7919813 Method of manufacturing semiconductor device and semiconductor device 2011-04-05
7786538 Semiconductor device having a nickel silicide layer on a single crystal silicon layer 2010-08-31
7755114 Semiconductor device and manufacturing method thereof 2010-07-13
7732875 Semiconductor device fabrication method and semiconductor device fabricated thereby 2010-06-08
7701017 MOS semiconductor device and method of fabricating the same 2010-04-20
7696575 Semiconductor device and method of manufacture thereof 2010-04-13
7678652 MOSFET-type semiconductor device, and method of manufacturing the same 2010-03-16
7622774 Method of manufacturing semiconductor device and semiconductor device 2009-11-24
7420230 MOSFET-type semiconductor device, and method of manufacturing the same 2008-09-02
7378344 Method of manufacturing a semiconductor device including a silicide layer having an NiSi phase provided on source and drain regions Shoko Tomita 2008-05-27
7157777 Semiconductor device including silicided source and drain electrodes Shoko Tomita 2007-01-02
7115905 Semiconductor device including forming an amorphous silicon layer over and reacting with a silicide layer 2006-10-03
7094693 Method of manufacturing semiconductor device and semiconductor device 2006-08-22
6815298 Method of forming a semiconductor device including forming an amorphous silicon layer over and reacting with a silicide layer 2004-11-09
6683356 Semiconductor device with oxygen doped regions 2004-01-27
6545327 Semiconductor device having different gate insulating films with different amount of carbon 2003-04-08
6271566 Semiconductor device having a carbon containing insulation layer formed under the source/drain 2001-08-07
6127237 Etching end point detecting method based on junction current measurement and etching apparatus 2000-10-03
6054371 Method of manufacturing a semiconductor device by detachably mounting substrates to a holder board Yasushi Nakasaki, Akira Nishiyama, Yukihito Oowaki, Hirotaka Nishino 2000-04-25
6051509 Semiconductor integrated circuit manufacturing method and device 2000-04-18
5963789 Method for silicon island formation 1999-10-05
5895255 Shallow trench isolation formation with deep trench cap 1999-04-20
5756391 Anti-oxidation layer formation by carbon incorporation 1998-05-26