KK

Koichi Kawai

KT Kabushiki Kaisha Toshiba: 52 patents #315 of 21,451Top 2%
Micron: 14 patents #1,151 of 6,345Top 20%
IN Intel: 4 patents #8,473 of 30,777Top 30%
ST Sandisk Technologies: 4 patents #141 of 394Top 40%
Toshiba Memory: 3 patents #621 of 1,971Top 35%
FU Fujifilm: 1 patents #3,076 of 4,519Top 70%
NC Nippon Kokan Co.: 1 patents #290 of 735Top 40%
Kioxia: 1 patents #1,054 of 1,813Top 60%
📍 Yokohama, CA: #46 of 287 inventorsTop 20%
Overall (All Time): #24,815 of 4,157,543Top 1%
76
Patents All Time

Issued Patents All Time

Showing 1–25 of 76 patents

Patent #TitleCo-InventorsDate
12293790 Memory for programming data states of memory cells Yoshihiko Kamata, Akira Goda 2025-05-06
12165710 Memory devices using a dynamic latch to provide multiple bias voltages Yoshihiko Kamata 2024-12-10
12136607 Semiconductor devices including stacked dies with interleaved wire bonds and associated systems and methods Raj K. Bansal, Takehiro Hasegawa, Chang Hua Siau 2024-11-05
11922993 Read-time overhead and power optimizations with command queues in memory device Sundararajan Sankaranarayanan, Eric N. Lee, Akira Goda 2024-03-05
11778827 Memory devices including multiplexer devices, and related electronic systems Yoshihiko Kamata, Yoshiaki Fukuzumi, Tamotsu Murakoshi 2023-10-03
11568921 Read-time overhead and power optimizations with command queues in memory device Sundararajan Sankaranarayanan, Eric N. Lee, Akira Goda 2023-01-31
11393845 Microelectronic devices, and related memory devices and electronic systems Yoshihiko Kamata, Yoshiaki Fukuzumi, Tamotsu Murakoshi 2022-07-19
11295823 Semiconductor integrated circuit adapted to output pass/fail results of internal operations Hiroshi Nakamura, Kenichi Imamiya, Toshio Yamamura, Koji Hosono 2022-04-05
10741266 Semiconductor integrated circuit adapted to output pass/fail results of internal operations Hiroshi Nakamura, Kenichi Imamiya, Toshio Yamamura, Koji Hosono 2020-08-11
10699790 Erase and soft program for vertical NAND flash Krishna K. Parat, Pranav Kalavade, Akira Goda 2020-06-30
10410731 Semiconductor integrated circuit adapted to output pass/fail results of internal operations Hiroshi Nakamura, Kenichi Imamiya, Toshio Yamamura, Koji Hosono 2019-09-10
10290356 Erase and soft program for vertical NAND flash Krishna K. Parat, Pranav Kalavade, Akira Goda 2019-05-14
9870831 Semiconductor integrated circuit adapted to output pass/fail results of internal operations Hiroshi Nakamura, Kenichi Imamiya, Toshio Yamamura, Koji Hosono 2018-01-16
9823880 Method and apparatus for initiating pre-read operation before completion of data load operation Tomoharu Tanaka 2017-11-21
9653171 Partial page memory operations Michael Abraham, Tomoharu Tanaka, Yuichi Einaga 2017-05-16
9536610 Semiconductor integrated circuit adapted to output pass/fail results of internal operations Hiroshi Nakamura, Kenichi Imamiya, Toshio Yamamura, Koji Hosono 2017-01-03
9536582 Enable/disable of memory chunks during memory access Toru Tanzawa, Satoru Tamada, Tetsuji Manabe 2017-01-03
9318199 Partial page memory operations Michael Abraham, Tomoharu Tanaka, Yuichi Einaga 2016-04-19
9312023 Devices and methods of programming memory cells Koji Sakui, Peter Feeley 2016-04-12
9305654 Erase and soft program for vertical NAND flash Krishna K. Parat, Pranav Kalavade, Akira Goda 2016-04-05
9064578 Enable/disable of memory chunks during memory access Toru Tanzawa, Satoru Tamada, Tetsuji Manabe 2015-06-23
8743625 Semiconductor integrated circuit adapted to output pass/fail results of internal operations Hiroshi Nakamura, Kenichi Imamiya, Toshio Yamamura, Koji Hosono 2014-06-03
8537623 Devices and methods of programming memory cells Koji Sakui, Peter Feeley 2013-09-17
8514624 In-field block retiring Krishna K. Parat, Akira Goda, Brian J. Soderling, Jeremy Binfet, Arnaud A. Furnemont +3 more 2013-08-20
8477541 Semiconductor integrated circuit adapted to output pass/fail results of internal operations Hiroshi Nakamura, Kenichi Imamiya, Toshio Yamamura, Koji Hosono 2013-07-02