KT

Ken Takeuchi

KT Kabushiki Kaisha Toshiba: 119 patents #55 of 21,451Top 1%
HC Hitachi Construction Machinery Co.: 14 patents #84 of 1,234Top 7%
TT The University Of Tokyo: 8 patents #85 of 2,633Top 4%
CU Chuo University: 3 patents #1 of 42Top 3%
HC Hitachi Kenki Fine Tech Co.: 1 patents #12 of 29Top 45%
HS Hitachi Automotive Systems: 1 patents #965 of 1,636Top 60%
KC Kcm: 1 patents #35 of 84Top 45%
📍 Stanford, CA: #2 of 1,454 inventorsTop 1%
🗺 California: #1,014 of 386,348 inventorsTop 1%
Overall (All Time): #6,387 of 4,157,543Top 1%
148
Patents All Time

Issued Patents All Time

Showing 76–100 of 148 patents

Patent #TitleCo-InventorsDate
7224617 Nonvolatile semiconductor memory 2007-05-29
7224612 Nonvolatile semiconductor memory device Tomoharu Tanaka, Hiroshi Nakamura, Riichiro Shirota, Fumitaka Arai, Susumu Fujimura 2007-05-29
7196932 Nonvolatile semiconductor memory having plural data storage portions for a bit line connected to memory cells Tomoharu Tanaka, Noboru Shibata 2007-03-27
7177196 Nonvolatile semiconductor memory having plural data storage portions for a bit line connected to memory cells Tomoharu Tanaka, Noboru Shibata 2007-02-13
7151685 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Hideko Oodaira, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2006-12-19
7057947 SEMICONDUCTOR DEVICE, NONVOLATILE SEMICONDUCTOR MEMORY, SYSTEM INCLUDING A PLURALITY OF SEMICONDUCTOR DEVICES OR NONVOLATILE SEMICONDUCTOR MEMORIES, ELECTRIC CARD INCLUDING SEMICONDUCTOR DEVICE OR NONVOLATILE SEMICONDUCTOR MEMORY, AND ELECTRIC DEVICE WITH WHICH THIS ELECTRIC CARD CAN BE USED Kazushige Kanda, Kenichi Imamiya, Hiroshi Nakamura, Tamio Ikehashi 2006-06-06
7009878 Data reprogramming/retrieval circuit for temporarily storing programmed/retrieved data for caching and multilevel logical functions in an EEPROM Koji Hosono, Hiroshi Nakamura, Kenichi Imamiya 2006-03-07
7002845 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Hideko Oodaira, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2006-02-21
6990003 Semiconductor memory device having a plurality of chips and capability of outputting a busy signal Hiroshi Nakamura, Kenichi Imamiya 2006-01-24
6974979 Nonvolatile semiconductor memory Hiroshi Watanabe, Hiroshi Nakamura, Kazuhiro Shimizu, Seiichi Aritome, Toshitake Yaegashi +3 more 2005-12-13
6970388 Non-volatile semiconductor memory Tamio Ikehashi, Toshihiko Himeno 2005-11-29
6940752 Nonvolatile semiconductor memory device Tomoharu Tanaka, Hiroshi Nakamura, Riichiro Shirota, Fumitaka Arai, Susumu Fujimura 2005-09-06
6937510 Non-volatile semiconductor memory Koji Hosono, Hiroshi Nakamura, Kenichi Imamiya 2005-08-30
6859401 Fail number detecting circuit of flash memory Koji Hosono, Tamio Ikehashi, Tomoharu Tanaka, Kenichi Imamiya, Hiroshi Nakamura 2005-02-22
6836444 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Hideko Oodaira, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2004-12-28
6819596 Semiconductor memory device with test mode Tamio Ikehashi, Toshihiko Himeno 2004-11-16
6801060 Semiconductor integrated circuit Tamio Ikehashi, Yoshihisa Sugiura, Kenichi Imamiya, Yoshihisa Iwata 2004-10-05
6798698 Nonvolatile semiconductor memory device Tomoharu Tanaka, Hiroshi Nakamura, Riichiro Shirota, Fumitaka Arai, Susumu Fujimura 2004-09-28
6698291 Ultrasonic inspection apparatus Noboru Yamamoto, Naoya Kawakami, Toshiyuki Hebaru, Makoto Ishijima, Tohru Miyata 2004-03-02
6680858 Semiconductor memory device having a plurality of chips and capability of outputting a busy signal Hiroshi Nakamura, Kenichi Imamiya 2004-01-20
6674318 Semiconductor integrated circuit Kazushige Kanda, Tamio Ikehashi, Kenichi Imamiya 2004-01-06
6667904 Multi-level non-volatile semiconductor memory device with verify voltages having a smart temperature coefficient Tomoharu Tanaka 2003-12-23
6657896 Fail number detecting circuit of flash memory Koji Hosono, Tamio Ikehashi, Tomoharu Tanaka, Kenichi Imamiya, Hiroshi Nakamura 2003-12-02
6646930 Non-volatile semiconductor memory Tamio Ikehashi, Toshihiko Himeno 2003-11-11
6643180 Semiconductor memory device with test mode Tamio Ikehashi, Toshihiko Himeno 2003-11-04