HO

Hideko Oodaira

KT Kabushiki Kaisha Toshiba: 26 patents #1,029 of 21,451Top 5%
Overall (All Time): #155,523 of 4,157,543Top 4%
26
Patents All Time

Issued Patents All Time

Showing 1–25 of 26 patents

Patent #TitleCo-InventorsDate
8665661 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2014-03-04
8350309 Nonvolatile semiconductor memory Hiroshi Watanabe, Hiroshi Nakamura, Kazuhiro Shimizu, Seiichi Aritome, Toshitake Yaegashi +3 more 2013-01-08
8259494 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2012-09-04
8248849 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2012-08-21
8084802 Nonvolatile semiconductor memory Hiroshi Watanabe, Hiroshi Nakamura, Kazuhiro Shimizu, Seiichi Aritome, Toshitake Yaegashi +3 more 2011-12-27
7893477 Nonvolatile semiconductor memory Hiroshi Watanabe, Hiroshi Nakamura, Kazuhiro Shimizu, Seiichi Aritome, Toshitake Yaegashi +3 more 2011-02-22
7787277 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2010-08-31
7425739 Nonvolatile semiconductor memory Hiroshi Watanabe, Hiroshi Nakamura, Kazuhiro Shimizu, Seiichi Aritome, Toshitake Yaegashi +3 more 2008-09-16
7359228 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2008-04-15
7332762 Nonvolatile semiconductor memory Hiroshi Watanabe, Hiroshi Nakamura, Kazuhiro Shimizu, Seiichi Aritome, Toshitake Yaegashi +3 more 2008-02-19
7151685 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2006-12-19
7002845 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2006-02-21
6974979 Nonvolatile semiconductor memory Hiroshi Watanabe, Hiroshi Nakamura, Kazuhiro Shimizu, Seiichi Aritome, Toshitake Yaegashi +3 more 2005-12-13
6836444 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2004-12-28
6611447 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2003-08-26
6512253 Nonvolatile semiconductor memory Hiroshi Watanabe, Hiroshi Nakamura, Kazuhiro Shimizu, Seiichi Aritome, Toshitake Yaegashi +3 more 2003-01-28
6487118 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, METHOD OF INVESTIGATING CAUSE OF FAILURE OCCURRING IN SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND METHOD OF VERIFYING OPERATION OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE Yoshihisa Iwata 2002-11-26
6424588 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2002-07-23
6353242 Nonvolatile semiconductor memory Hiroshi Watanabe, Hiroshi Nakamura, Kazuhiro Shimizu, Seiichi Aritome, Toshitake Yaegashi +3 more 2002-03-05
6335894 Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device Yoshihisa Iwata 2002-01-01
6240012 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Kenichi Imamiya, Kazuhito Narita, Kazuhiro Shimizu +1 more 2001-05-29
6172930 Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device Yoshihisa Iwata 2001-01-09
5943282 Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device Yoshihisa Iwata 1999-08-24
5812455 Semiconductor integrated circuit device, method of investigating cause of failure occurring in semiconductor integrated circuit device and method of verifying operation of semiconductor integrated circuit device Yoshihisa Iwata 1998-09-22
5734286 Driving device of charge pump circuit and driving pulse generation method thereof Yasuhisa Takeyama, Junichi Miyamoto, Yoshihisa Iwata, Hironori Banba 1998-03-31