KN

Kazuhito Narita

KT Kabushiki Kaisha Toshiba: 23 patents #1,224 of 21,451Top 6%
Overall (All Time): #185,389 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Showing 1–23 of 23 patents

Patent #TitleCo-InventorsDate
8665661 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhiro Shimizu +1 more 2014-03-04
8259494 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhiro Shimizu +1 more 2012-09-04
8248849 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhiro Shimizu +1 more 2012-08-21
7787277 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhiro Shimizu +1 more 2010-08-31
7359228 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhiro Shimizu +1 more 2008-04-15
7297599 Method of fabricating semiconductor device Norio Ohtani, Hirohisa Iizuka, Hiroaki Hazama, Eiji Kamiya 2007-11-20
7238975 Nonvolatile semiconductor memory device and manufacturing method therefor Hiroaki Hazama, Seiichi Mori, Hirohisa Iizuka, Norio Ootani 2007-07-03
7195968 Method of fabricating semiconductor device Eiji Kamiya, Hirohisa Iizuka, Hiroaki Hazama, Norio Ohtani 2007-03-27
7151685 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhiro Shimizu +1 more 2006-12-19
7002845 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhiro Shimizu +1 more 2006-02-21
6933194 Method of manufacturing semiconductor device using STI technique Eiji Sakagami, Hiroaki Tsunoda, Masahisa Sonoda, Hideyuki Kobayashi 2005-08-23
6836444 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhiro Shimizu +1 more 2004-12-28
6642568 Semiconductor device and method of manufacturing the same Eiji Sakagami, Hiroaki Tsunoda, Masahisa Sonoda, Hideyuki Kobayashi 2003-11-04
6611447 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhiro Shimizu +1 more 2003-08-26
6462373 Nonvolatile semiconductor memory device having tapered portion on side wall of charge accumulation layer Kazuhiro Shimizu, Riichiro Shirota, Naoki Koido, Seiichi Aritome, Hiroaki Tsunoda +3 more 2002-10-08
6424588 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhiro Shimizu +1 more 2002-07-23
6413809 Method of manufacturing a non-volatile memory having an element isolation insulation film embedded in the trench Takuya Nakamura, Naoki Koido, Hirohisa Iizuka, Seiichi Aritome, Fumitaka Arai 2002-07-02
6342715 Nonvolatile semiconductor memory device Kazuhiro Shimizu, Seiichi Aritome, Toshiharu Watanabe 2002-01-29
6340611 Nonvolatile semiconductor memory device Kazuhiro Shimizu, Seiichi Aritome, Toshiharu Watanabe 2002-01-22
6258665 Non-volatile semiconductor memory device and method for manufacturing the same Kazuhiro Shimizu, Seiichi Aritome 2001-07-10
6240012 Semiconductor memory device capable of realizing a chip with high operation reliability and high yield Hiroshi Nakamura, Ken Takeuchi, Hideko Oodaira, Kenichi Imamiya, Kazuhiro Shimizu +1 more 2001-05-29
6222225 Semiconductor device and manufacturing method thereof Takuya Nakamura, Naoki Koido, Hirohisa Iizuka, Seiichi Aritome, Fumitaka Arai 2001-04-24
5856241 Method of manufacturing semiconductor device 1999-01-05