Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10456965 | Method of manufacturing a composite | Shuji Tatsuno, Tomohiro Saito, Yuya OSHIMA | 2019-10-29 |
| 10203089 | Light flux controlling member, light emitting device and method for manufacturing light flux controlling member | Shuji Tatsuno | 2019-02-12 |
| 7732763 | Pattern inspection method, pattern inspection apparatus, semiconductor device manufacturing method, and program | — | 2010-06-08 |
| 7554082 | Pattern observation apparatus, pattern observation method, method of manufacturing semiconductor device, and program | — | 2009-06-30 |
| 7521678 | Charged particle beam apparatus, charged particle beam focusing method, microstructure measuring method, microstructure inspecting method, semiconductor device manufacturing method, and program | Hideaki Abe | 2009-04-21 |
| 6111981 | Method and apparatus for processing pattern image data by SEM | Koji Tsubusaki, Fumio Komatsu | 2000-08-29 |
| 5887080 | Method and apparatus for processing pattern image data by SEM | Koji Tsubusaki, Fumio Komatsu | 1999-03-23 |
| 5811803 | Electron microscope | Fumio Komatsu | 1998-09-22 |