YK

Yuko Kariya

HH Hitachi High-Technologies: 1 patents #1,282 of 1,917Top 70%
Overall (All Time): #3,212,772 of 4,157,543Top 80%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8209135 Wafer inspection data handling and defect review tool Tomohiro Funakoshi, Junko Konishi, Noritsugu Takahashi, Fumiaki Endo 2012-06-26