| 8749260 |
Test wafer unit and test system |
Yasuo Tokunaga |
2014-06-10 |
| 8667669 |
Apparatus and method for manufacturing a packaged device |
— |
2014-03-11 |
| 8652857 |
Test apparatus, test method and manufacturing method for testing a device under test packaged in a test package |
— |
2014-02-18 |
| 8624620 |
Test system and write wafer |
Yasuo Tokunaga |
2014-01-07 |
| 8427187 |
Probe wafer, probe device, and testing system |
Yoshiharu Umemura |
2013-04-23 |
| 8410807 |
Test system and probe apparatus |
Yoshiharu Umemura |
2013-04-02 |
| 8289040 |
Test wafer unit and test system |
Yoshiharu Umemura, Shinichi Hamaguchi, Yasushi Kawaguchi |
2012-10-16 |
| 8253428 |
Probe apparatus and test apparatus |
— |
2012-08-28 |
| 8134379 |
Probe wafer, probe device, and testing system |
Yoshiharu Umemura |
2012-03-13 |
| 5740086 |
Semiconductor test system linked to cad data |
— |
1998-04-14 |