Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8749260 | Test wafer unit and test system | Yoshio Komoto | 2014-06-10 |
| 8624620 | Test system and write wafer | Yoshio Komoto | 2014-01-07 |
| 5214284 | Method and arrangement for testing and repairing an integrated circuit | Jürgen Frosien | 1993-05-25 |
| 4243262 | Rear window structure for automobile | Kiyoshige Yamada | 1981-01-06 |