Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7414721 | In-situ metrology system and method for monitoring metalization and other thin film formation | Agajan Suvkhanov | 2008-08-19 |
| 7189628 | Fabrication of trenches with multiple depths on the same substrate | Mohammad R. Mirbedini, Venkatesh P. Gopinath, Hong Lin, Verne Hornback, Dodd Defibaugh | 2007-03-13 |
| 6864152 | Fabrication of trenches with multiple depths on the same substrate | Mohammad R. Mirbedini, Venkatesh P. Gopinath, Hong Lin, Verne Hornback, Dodd Defibaugh | 2005-03-08 |
| 6355577 | System to reduce particulate contamination | Steven Reder | 2002-03-12 |