Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12100506 | Control systems and methods | Walter Arturo AGUILAR, Johannes Stahl, Shaomin XIAO | 2024-09-24 |
| 8798966 | Measuring critical dimensions of a semiconductor structure | John J. Hench, Daniel Wack, Edward Ratner, Andrei Veldman | 2014-08-05 |