Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4406948 | Device for measuring thin films by means of beta radiation | Helmut Fischer, Werner Volz | 1983-09-27 |
| 4401518 | Method of measuring thickness of a tin layer and thickness measuring device therefor | Helmut Fischer | 1983-08-30 |
| 4293767 | Apparatus for measuring the thickness of thin layers | Helmut Fischer, Albert Ott | 1981-10-06 |