Issued Patents All Time
Showing 1–25 of 128 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11867666 | Measuring system, measuring arrangement and method for determining measuring signals during a penetration movement of a penetration body into a surface of a test body | — | 2024-01-09 |
| 11385151 | Measuring device and detection of measurement signals during a penetrating movement of penetrating member | — | 2022-07-12 |
| 10837888 | Measuring system, measuring arrangement, and method for determining measuring signals during a penetration movement of a penetration body into a surface of a test body | — | 2020-11-17 |
| 10584952 | Measuring probe for non-destructive measuring of the thickness of thin layers | — | 2020-03-10 |
| 9857171 | Measuring probe for non-destructive measuring of the thickness of thin layers | — | 2018-01-02 |
| 9835439 | Method for electronic control of a measurement stand | — | 2017-12-05 |
| 9772205 | Method for electronically activating a measurement stand, and measurement stand for supporting a measuring probe | — | 2017-09-26 |
| 9605940 | Measuring probe for measuring the thickness of thin layers, and method for the production of a sensor element for the measuring probe | — | 2017-03-28 |
| 9458944 | Hydraulic safety and movement control system | Dirk Bracht | 2016-10-04 |
| 9435629 | Measuring probe with shielding element for measuring the thickness of thin layers | — | 2016-09-06 |
| 9074880 | Measuring probe for non-destructive measuring of the thickness of thin layers | — | 2015-07-07 |
| 9076897 | Optoelectronic semiconductor device and method for producing an optoelectronic semiconductor device | Andreas Plössl | 2015-07-07 |
| 9041020 | Electrolytically coated optoelectronic semiconductor component and method for producing an optoelectronic semiconductor component | Siegfried Herrmann | 2015-05-26 |
| 8745889 | Measurement stand and method of its electrical control | — | 2014-06-10 |
| 8560269 | Method for outputting measured values and display device | — | 2013-10-15 |
| 8474151 | Method and device for measuring the thickness of thin layers over large-area surfaces to be measured | — | 2013-07-02 |
| 7906352 | Chip and method for producing a chip | Herbert Brunner, Dieter Eissler, Ewald Guenther, Alexander Heindl | 2011-03-15 |
| 7784325 | Calibration standard | — | 2010-08-31 |
| 7690243 | Method and apparatus for measurement of the thickness of thin layers by means of measurement probe | — | 2010-04-06 |
| 7610690 | Measurement stand for holding a measuring instrument | — | 2009-11-03 |
| 7549314 | Calibrating device for adapting a measuring device for measuring the thickness of thin layers on an object to be measured | — | 2009-06-23 |
| 7472491 | Measuring probe, especially for a device for the measurement of the thickness of thin layers | — | 2009-01-06 |
| 7448250 | Calibration standard | — | 2008-11-11 |
| 7428671 | Memory module with test structure | Johann Pfeiffer | 2008-09-23 |
| 7359278 | Method for producing an integrated memory module | — | 2008-04-15 |