Issued Patents All Time
Showing 25 most recent of 39 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11933816 | Portable probe card assembly | Garrett TRANQUILLO, Riley KAISER | 2024-03-19 |
| 11313902 | Modular rail systems, rail systems, mechanisms, and equipment for devices under test | John Dunklee, Bryan J. Root | 2022-04-26 |
| 11275106 | High voltage probe card system | Adam Schultz, Bryan J. Root | 2022-03-15 |
| 10976347 | Magnet extension | Bryan J. Root | 2021-04-13 |
| 10620262 | Modular rail systems, rail systems, mechanisms, and equipment for devices under test | John Dunklee, Bryan J. Root | 2020-04-14 |
| 10295565 | Probe card with stress relieving feature | John Dunklee | 2019-05-21 |
| 10261124 | Modular rail systems, rail systems, mechanisms, and equipment for devices under test | John Dunklee, Bryan J. Root | 2019-04-16 |
| 10254309 | Test apparatus having a probe core with a latch mechanism | John Dunklee, Bryan J. Root | 2019-04-09 |
| 10145863 | Test systems with a probe apparatus and index mechanism | John Dunklee, Bryan J. Root | 2018-12-04 |
| 9910067 | Apparatus and method for terminating probe apparatus of semiconductor wafer | Bryan J. Root | 2018-03-06 |
| 9726694 | Test systems with a probe apparatus and index mechanism | John Dunklee, Bryan J. Root | 2017-08-08 |
| 9678149 | Test apparatus having a probe core with a twist lock mechanism | Bryan J. Root | 2017-06-13 |
| 9279829 | Apparatus and method for terminating probe apparatus of semiconductor wafer | Bryan J. Root | 2016-03-08 |
| 9024651 | Test apparatus having a probe card and connector mechanism | Bryan J. Root, Michael Palumbo, John Dunklee | 2015-05-05 |
| 9018966 | Test apparatus having a probe card and connector mechanism | Bryan J. Root, John Dunklee | 2015-04-28 |
| 8994390 | Test systems with a probe apparatus and index mechanism | Bryan J. Root, John Dunklee | 2015-03-31 |
| D722031 | Top contact layout board in an electrical system | John Dunklee, Matthew Page, Dennis Flanders, Bryan J. Root | 2015-02-03 |
| 8860450 | Apparatus and method for terminating probe apparatus of semiconductor wafer | Bryan J. Root | 2014-10-14 |
| D713363 | Support for a probe test core | Dennis Flanders, John Dunklee, Bryan J. Root | 2014-09-16 |
| 8698515 | Probe test equipment for testing a semiconductor device | Bryan J. Root | 2014-04-15 |
| 8674715 | Test apparatus having a probe core with a twist lock mechanism | Bryan J. Root | 2014-03-18 |
| 8354856 | Replaceable probe apparatus for probing semiconductor wafer | Bryan J. Root | 2013-01-15 |
| 8149009 | Apparatus and method for terminating probe apparatus of semiconductor wafer | Bryan J. Root | 2012-04-03 |
| D654033 | Grooved wire support for a probe test core | Bryan J. Root | 2012-02-14 |
| 7999564 | Replaceable probe apparatus for probing semiconductor wafer | Bryan J. Root | 2011-08-16 |